X-ray & Surface Analysis
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The X-ray & Surface Analysis facilities within the McCullough building feature advanced XPS, XRD and SPM characterization techniques.
- XRD: PANalytical Empyrean
- XRD: PANalytical X'Pert 2
- XRD: Multiwire Laue
- XRD: Bruker Single Crystal D8 Venture
- XCT: Zeiss Xradia Versa 520 X-ray CT
- Auger: PHI 700
- XPS: PHI VersaProbe 1
- XPS: PHI VersaProbe 3
- PESA: Riken AC-2 Photoelectron Spectrometer
- SPM: Park XE-70
- SPM: Park XE-100
- SPM: Scanning SQUID Microscope