GLAM hosts the Electron and Ion Microscopy and X-Ray and Surface Analysis capabilities of the Stanford Nano Shared Facilities.
For lab access information at these facilities, please visit http://snsf.stanford.edu/about/join.html
SNSF Equipment in the McCullough and Moore building include:
- Electron and Ion Microscopy Laboratories
- FIB/SEM: FEI DB235
- SEM: FEI Sirion
- Transmission Electron Microscope (TEM) Facilities
- FEI Tecnai
- TEM Specimen Preparation Laboratory
- X-ray & Surface Analysis
- XRD PANalytical X/Pert
- XRD PANalytical Empyrean
- XRD Multiwire Laue
- XRD Bruker Single Crystal D8 Venture
- Auger: PHI 700
- XPS: PHI VersaProbe
- PESA: Riken AC-2 Photoelectron Spectrometer
- SPM: Park XE-70
- SPM: PARK XE-100
- SPM: Scanning SQUID Microscope
