Main content start
Senior Research Scientist - Physical
Arturas Vailionis
Senior Research Scientist - Physical
Dr. Arturas Vailionis has been an integral part of Stanford University since 2000, serving as the Senior Staff Scientist at Stanford Nano Shared Facilities (SNSF). Within SNSF, he oversees the X-ray Lab, comprising X-ray Diffraction and X-ray Computed Tomography instruments. Additionally, Dr. Vailionis plays a key role as the core lead of the X-ray and Surface Analysis (XSA) group at SNSF. He also holds a Lecturer position in the Materials Science & Engineering Department and serves as a visiting professor at Kaunas University of Technology in Lithuania.
Dr. Vailionis earned his PhD from the Royal Institute of Technology, where he focused on the growth and structural characterization of high-Tc superconductor thin films. Subsequently, he conducted research in the group of Prof. Joe Greene at the University of Illinois at Urbana Champaign, investigating atomic structure, morphology, and growth kinetics of semiconductor and nitride thin films using X-ray Diffraction and Scanning Probe Microscopy.
Dr. Vailionis research interests encompass a wide range of X-ray scattering techniques aimed at understanding structural properties of materials at the atomic level, particularly focusing on complex oxide thin films and heterostructures. He has coauthored over 100 publications covering topics such as microstructure, electronic, and magnetic properties in thin films. Additionally, his expertise extends to tomographic imaging of inorganic and biological materials.
Dr. Vailionis earned his PhD from the Royal Institute of Technology, where he focused on the growth and structural characterization of high-Tc superconductor thin films. Subsequently, he conducted research in the group of Prof. Joe Greene at the University of Illinois at Urbana Champaign, investigating atomic structure, morphology, and growth kinetics of semiconductor and nitride thin films using X-ray Diffraction and Scanning Probe Microscopy.
Dr. Vailionis research interests encompass a wide range of X-ray scattering techniques aimed at understanding structural properties of materials at the atomic level, particularly focusing on complex oxide thin films and heterostructures. He has coauthored over 100 publications covering topics such as microstructure, electronic, and magnetic properties in thin films. Additionally, his expertise extends to tomographic imaging of inorganic and biological materials.
Education
M.Sc., Vilnius University, Vilnius, Lithuania, Growth of Oxide Thin Films by Magnetron Sputtering and Characterization (1989)
Ph. D., Royal Institute of Technology, Stockholm, Sweden, Microstructural Properties of Oxide Thin Films Studied by X-ray Diffraction and Extended X-ray Absorption Fine Structure. (1997)
Contact
(650) 736-1186
Mail Code
0210